TEST_NAME : Wafer
TEST_DATE : 24_09_25-14_46_33
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-008-002-15 | FUSED_ID : 6359364768406470703
  IC_TEMP :  -56.09 | VDDM : 1132.09 | AUX_INT : -158.16 | CsaBias :  -49.90
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.21963e-03 / 2
  ADC_P0  : -1.58160e-01 ± 3.09947e-02
  ADC_P1  : 1.09784e-02 ± 7.27811e-04
  ADC_P2  : -1.52733e-05 ± 3.34775e-06
  CSA_Chi2/NDF : 1.10651e-04 / 2
  CSA_P0  : 5.67804e-02 ± 7.01616e-03
  CSA_P1  : 9.40337e-03 ± 5.28617e-04
  CSA_P2  : -3.91550e-05 ± 8.05021e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [34]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [114]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2761', '1.800', '0.1700', '1.799', '0.0901', '7.000', '0.7080', 1, 1, 1, 1, 1727268392.9774225]
VI_after__Init : ['1.202', '0.2762', '1.800', '0.1700', '1.800', '0.0844', '7.000', '0.7078', 1, 1, 1, 1, 1727268401.2358806]
VI_at__the_End : ['1.202', '0.4881', '1.800', '0.1377', '1.800', '0.1111', '7.000', '0.7086', 1, 1, 1, 1, 1727268462.7709394]