TEST_NAME : Wafer
TEST_DATE : 24_09_25-14_49_48
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-008-004-15 | FUSED_ID : 6359364768406470735
  IC_TEMP :  -58.42 | VDDM : 1127.41 | AUX_INT :   -7.50 | CsaBias :   90.68
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.24271e-03 / 2
  ADC_P0  : -7.49723e-03 ± 2.38780e-02
  ADC_P1  : 8.25040e-03 ± 5.75452e-04
  ADC_P2  : -5.71992e-06 ± 2.75060e-06
  CSA_Chi2/NDF : 1.29864e-04 / 2
  CSA_P0  : 5.82544e-02 ± 7.60094e-03
  CSA_P1  : 9.60567e-03 ± 5.72676e-04
  CSA_P2  : -4.19533e-05 ± 8.72118e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [40, 104, 113]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [72]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.2831', '1.800', '0.1595', '1.800', '0.0878', '7.000', '0.7079', 1, 1, 1, 1, 1727268587.5542765]
VI_after__Init : ['1.202', '0.2833', '1.800', '0.1595', '1.800', '0.0824', '7.000', '0.7081', 1, 1, 1, 1, 1727268596.4446585]
VI_at__the_End : ['1.201', '0.4928', '1.800', '0.1399', '1.804', '0.1154', '7.000', '0.7086', 1, 1, 1, 1, 1727268658.8147178]