TEST_NAME : Wafer
TEST_DATE : 24_09_25-14_51_26
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-008-005-15 | FUSED_ID : 6359364768406470751
  IC_TEMP :  -56.65 | VDDM : 1128.76 | AUX_INT :   -6.86 | CsaBias :   77.17
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.52830e-04 / 2
  ADC_P0  : -6.86288e-03 ± 1.97427e-02
  ADC_P1  : 8.46538e-03 ± 4.88132e-04
  ADC_P2  : -6.25649e-06 ± 2.38197e-06
  CSA_Chi2/NDF : 1.17538e-04 / 2
  CSA_P0  : 5.93756e-02 ± 7.23123e-03
  CSA_P1  : 9.61261e-03 ± 5.44821e-04
  CSA_P2  : -4.19943e-05 ± 8.29698e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [43]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [6, 123]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2785', '1.800', '0.1386', '1.800', '0.0838', '7.000', '0.7081', 1, 1, 1, 1, 1727268685.7346816]
VI_after__Init : ['1.202', '0.2785', '1.800', '0.1387', '1.800', '0.0785', '7.000', '0.7079', 1, 1, 1, 1, 1727268694.4440339]
VI_at__the_End : ['1.202', '0.4946', '1.800', '0.1388', '1.801', '0.1119', '7.000', '0.7087', 1, 1, 1, 1, 1727268753.9743974]