TEST_NAME : Wafer
TEST_DATE : 24_09_25-14_53_04
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-008-006-15 | FUSED_ID : 6359364768406470767
  IC_TEMP :  -61.58 | VDDM : 1127.49 | AUX_INT :   -6.70 | CsaBias :   77.32
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.11707e-03 / 2
  ADC_P0  : -6.70354e-03 ± 2.26407e-02
  ADC_P1  : 8.46225e-03 ± 5.65989e-04
  ADC_P2  : -6.00650e-06 ± 2.78496e-06
  CSA_Chi2/NDF : 1.19378e-04 / 2
  CSA_P0  : 5.92628e-02 ± 7.28760e-03
  CSA_P1  : 9.48199e-03 ± 5.49068e-04
  CSA_P2  : -4.19502e-05 ± 8.36165e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [116]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [36]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4019', '1.800', '0.1327', '1.800', '0.1002', '7.000', '0.7080', 1, 1, 1, 1, 1727268783.9021077]
VI_after__Init : ['1.202', '0.4012', '1.800', '0.1327', '1.800', '0.0945', '7.000', '0.7079', 1, 1, 1, 1, 1727268792.0375109]
VI_at__the_End : ['1.202', '0.4863', '1.800', '0.1391', '1.800', '0.1123', '7.000', '0.7086', 1, 1, 1, 1, 1727268853.8377886]