TEST_NAME : Wafer
TEST_DATE : 24_09_25-14_57_57
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-008-009-15 | FUSED_ID : 6359364768406470815
  IC_TEMP :  -56.11 | VDDM : 1129.71 | AUX_INT :   -7.52 | CsaBias :   72.19
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.96547e-04 / 2
  ADC_P0  : -7.51909e-03 ± 2.02241e-02
  ADC_P1  : 8.02845e-03 ± 4.70714e-04
  ADC_P2  : -5.75477e-06 ± 2.16556e-06
  CSA_Chi2/NDF : 8.66681e-05 / 2
  CSA_P0  : 5.71348e-02 ± 6.20943e-03
  CSA_P1  : 9.40629e-03 ± 4.67836e-04
  CSA_P2  : -3.98748e-05 ± 7.12459e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [15, 86, 115]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3527', '1.800', '0.1258', '1.800', '0.0873', '7.000', '0.7079', 1, 1, 1, 1, 1727269077.029567]
VI_after__Init : ['1.201', '0.3531', '1.800', '0.1258', '1.801', '0.0821', '7.000', '0.7080', 1, 1, 1, 1, 1727269085.8477767]
VI_at__the_End : ['1.201', '0.4863', '1.800', '0.1373', '1.800', '0.1130', '7.000', '0.7086', 1, 1, 1, 1, 1727269145.3253045]