TEST_NAME : Wafer
TEST_DATE : 24_09_25-14_59_35
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-008-010-15 | FUSED_ID : 6359364768406470831
  IC_TEMP :  -51.28 | VDDM : 1131.31 | AUX_INT :   -6.86 | CsaBias :   91.84
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.03349e-03 / 2
  ADC_P0  : -6.86191e-03 ± 2.17762e-02
  ADC_P1  : 8.29243e-03 ± 5.34940e-04
  ADC_P2  : -5.57771e-06 ± 2.59406e-06
  CSA_Chi2/NDF : 1.09829e-04 / 2
  CSA_P0  : 5.92882e-02 ± 6.99005e-03
  CSA_P1  : 9.50942e-03 ± 5.26650e-04
  CSA_P2  : -3.93007e-05 ± 8.02025e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [22, 30, 98]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [18]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3074', '1.800', '0.1209', '1.800', '0.0865', '7.000', '0.7080', 1, 1, 1, 1, 1727269174.891998]
VI_after__Init : ['1.201', '0.3075', '1.800', '0.1209', '1.800', '0.0809', '7.000', '0.7082', 1, 1, 1, 1, 1727269182.9653754]
VI_at__the_End : ['1.201', '0.5007', '1.800', '0.1420', '1.800', '0.1108', '7.000', '0.7087', 1, 1, 1, 1, 1727269249.413231]