TEST_NAME : Wafer
TEST_DATE : 24_09_25-15_02_51
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-008-012-15 | FUSED_ID : 6359364768406470863
  IC_TEMP :  -55.17 | VDDM : 1110.47 | AUX_INT :   -7.52 | CsaBias :   91.74
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.06885e-03 / 2
  ADC_P0  : -7.52127e-03 ± 2.21288e-02
  ADC_P1  : 8.34307e-03 ± 5.40705e-04
  ADC_P2  : -5.93178e-06 ± 2.61001e-06
  CSA_Chi2/NDF : 7.41732e-05 / 2
  CSA_P0  : 5.91456e-02 ± 5.74442e-03
  CSA_P1  : 9.40119e-03 ± 4.32800e-04
  CSA_P2  : -3.96554e-05 ± 6.59104e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3006', '1.800', '0.1670', '1.800', '0.0941', '7.000', '0.7079', 1, 1, 1, 1, 1727269370.9309502]
VI_after__Init : ['1.201', '0.3012', '1.800', '0.1670', '1.800', '0.0887', '7.000', '0.7080', 1, 1, 1, 1, 1727269378.9262478]
VI_at__the_End : ['1.201', '0.4910', '1.800', '0.1383', '1.800', '0.1124', '7.000', '0.7086', 1, 1, 1, 1, 1727269439.3226867]