TEST_NAME : Wafer
TEST_DATE : 24_09_25-15_04_29
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-008-013-15 | FUSED_ID : 6359364768406470879
  IC_TEMP :  -60.55 | VDDM : 1110.79 | AUX_INT :   -7.62 | CsaBias :   75.30
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.43044e-03 / 2
  ADC_P0  : -7.61591e-03 ± 2.57044e-02
  ADC_P1  : 8.34184e-03 ± 6.44815e-04
  ADC_P2  : -4.99076e-06 ± 3.20376e-06
  CSA_Chi2/NDF : 1.58151e-04 / 2
  CSA_P0  : 5.88661e-02 ± 8.38801e-03
  CSA_P1  : 1.03207e-02 ± 6.31976e-04
  CSA_P2  : -5.39550e-05 ± 9.62424e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [16, 118, 119]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3292', '1.800', '0.1628', '1.800', '0.0915', '7.000', '0.7081', 1, 1, 1, 1, 1727269469.781357]
VI_after__Init : ['1.201', '0.3293', '1.800', '0.1629', '1.800', '0.0856', '7.000', '0.7081', 1, 1, 1, 1, 1727269477.8137622]
VI_at__the_End : ['1.201', '0.4927', '1.800', '0.1388', '1.800', '0.1111', '7.000', '0.7086', 1, 1, 1, 1, 1727269544.648624]