TEST_NAME : Wafer
TEST_DATE : 24_09_25-15_06_07
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-008-014-15 | FUSED_ID : 6359364768406470895
  IC_TEMP :  -50.67 | VDDM : 1128.30 | AUX_INT :   -8.07 | CsaBias :   87.95
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.16837e-03 / 2
  ADC_P0  : -8.06618e-03 ± 2.31619e-02
  ADC_P1  : 8.06454e-03 ± 5.49985e-04
  ADC_P2  : -5.26443e-06 ± 2.58943e-06
  CSA_Chi2/NDF : 8.00616e-05 / 2
  CSA_P0  : 5.89330e-02 ± 5.96808e-03
  CSA_P1  : 9.32027e-03 ± 4.49652e-04
  CSA_P2  : -3.83143e-05 ± 6.84766e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [70, 104]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [12, 47]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3960', '1.800', '0.1276', '1.800', '0.0895', '7.000', '0.7081', 1, 1, 1, 1, 1727269567.4168344]
VI_after__Init : ['1.201', '0.3961', '1.800', '0.1276', '1.800', '0.0838', '7.000', '0.7081', 1, 1, 1, 1, 1727269575.4532588]
VI_at__the_End : ['1.201', '0.4931', '1.800', '0.1393', '1.800', '0.1113', '7.000', '0.7090', 1, 1, 1, 1, 1727269640.205233]