TEST_NAME : Wafer
TEST_DATE : 24_09_25-15_09_22
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-008-016-08 | FUSED_ID : 6359364768406470920
  IC_TEMP :  -54.73 | VDDM : 1111.33 | AUX_INT :   -8.94 | CsaBias :   83.19
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.32422e-03 / 2
  ADC_P0  : -8.94280e-03 ± 2.46385e-02
  ADC_P1  : 8.44431e-03 ± 6.02781e-04
  ADC_P2  : -6.21287e-06 ± 2.92575e-06
  CSA_Chi2/NDF : 1.17411e-04 / 2
  CSA_P0  : 5.84935e-02 ± 7.22732e-03
  CSA_P1  : 9.91131e-03 ± 5.44526e-04
  CSA_P2  : -4.45474e-05 ± 8.29249e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3059', '1.799', '0.1325', '1.800', '0.0919', '7.000', '0.7089', 1, 1, 1, 1, 1727269762.3873956]
VI_after__Init : ['1.201', '0.3061', '1.800', '0.1326', '1.800', '0.0849', '7.000', '0.7084', 1, 1, 1, 1, 1727269770.4486556]
VI_at__the_End : ['1.201', '0.5029', '1.800', '0.1412', '1.800', '0.1113', '7.000', '0.7086', 1, 1, 1, 1, 1727269835.4097772]