TEST_NAME : Wafer
TEST_DATE : 24_09_25-15_11_00
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-008-017-08 | FUSED_ID : 6359364768406470936
  IC_TEMP :  -52.58 | VDDM : 1128.25 | AUX_INT :   -5.06 | CsaBias :   83.98
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 6.75557e-04 / 2
  ADC_P0  : -5.05514e-03 ± 1.75737e-02
  ADC_P1  : 8.15426e-03 ± 4.27407e-04
  ADC_P2  : -5.43644e-06 ± 2.04233e-06
  CSA_Chi2/NDF : 7.74387e-05 / 2
  CSA_P0  : 5.83287e-02 ± 5.86950e-03
  CSA_P1  : 9.38275e-03 ± 4.42225e-04
  CSA_P2  : -3.80114e-05 ± 6.73456e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [15, 101, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2187', '1.800', '0.1740', '1.800', '0.0921', '7.000', '0.7090', 1, 1, 1, 1, 1727269860.2019439]
VI_after__Init : ['1.201', '0.2186', '1.800', '0.1740', '1.799', '0.0848', '7.000', '0.7081', 1, 1, 1, 1, 1727269868.2105103]
VI_at__the_End : ['1.201', '0.4955', '1.800', '0.1387', '1.800', '0.1104', '7.000', '0.7088', 1, 1, 1, 1, 1727269935.3414743]