TEST_NAME : Wafer
TEST_DATE : 24_09_25-15_12_37
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-008-018-08 | FUSED_ID : 6359364768406470952
  IC_TEMP :  -54.01 | VDDM : 1126.15 | AUX_INT :   -7.31 | CsaBias :   90.16
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.05205e-03 / 2
  ADC_P0  : -7.30967e-03 ± 2.19404e-02
  ADC_P1  : 8.19347e-03 ± 5.23696e-04
  ADC_P2  : -5.94671e-06 ± 2.46495e-06
  CSA_Chi2/NDF : 8.66299e-05 / 2
  CSA_P0  : 5.94607e-02 ± 6.20806e-03
  CSA_P1  : 9.31242e-03 ± 4.67733e-04
  CSA_P2  : -3.75584e-05 ± 7.12302e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [81, 124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3789', '1.800', '0.1319', '1.800', '0.0877', '7.000', '0.7080', 1, 1, 1, 1, 1727269957.5177236]
VI_after__Init : ['1.201', '0.3790', '1.800', '0.1319', '1.800', '0.0822', '7.000', '0.7079', 1, 1, 1, 1, 1727269965.76419]
VI_at__the_End : ['1.201', '0.4939', '1.800', '0.1370', '1.799', '0.1115', '7.000', '0.7089', 1, 1, 1, 1, 1727270024.289792]