TEST_NAME : Wafer
TEST_DATE : 24_09_25-15_15_53
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-008-020-08 | FUSED_ID : 6359364768406470984
  IC_TEMP :  -48.66 | VDDM : 1108.73 | AUX_INT :   -7.83 | CsaBias :   95.80
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.02494e-03 / 2
  ADC_P0  : -7.82571e-03 ± 2.16621e-02
  ADC_P1  : 8.04124e-03 ± 5.10017e-04
  ADC_P2  : -5.40436e-06 ± 2.37985e-06
  CSA_Chi2/NDF : 5.57741e-05 / 2
  CSA_P0  : 6.01934e-02 ± 4.98125e-03
  CSA_P1  : 9.17492e-03 ± 3.75301e-04
  CSA_P2  : -3.34540e-05 ± 5.71540e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [3, 12]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [70, 75]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1783', '1.800', '0.1481', '1.800', '0.0876', '7.000', '0.7080', 1, 1, 1, 1, 1727270153.0092547]
VI_after__Init : ['1.201', '0.1782', '1.800', '0.1481', '1.799', '0.0823', '7.000', '0.7082', 1, 1, 1, 1, 1727270161.1415935]
VI_at__the_End : ['1.201', '0.5018', '1.800', '0.1382', '1.800', '0.1083', '7.000', '0.7088', 1, 1, 1, 1, 1727270220.0201344]