TEST_NAME : Wafer
TEST_DATE : 24_09_25-15_17_31
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-008-021-08 | FUSED_ID : 6359364768406471000
  IC_TEMP :  -52.35 | VDDM : 1125.91 | AUX_INT :   -8.25 | CsaBias :   81.52
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.09524e-03 / 2
  ADC_P0  : -8.25151e-03 ± 2.23831e-02
  ADC_P1  : 8.22551e-03 ± 5.34779e-04
  ADC_P2  : -5.86033e-06 ± 2.53302e-06
  CSA_Chi2/NDF : 1.07643e-04 / 2
  CSA_P0  : 5.94999e-02 ± 6.92015e-03
  CSA_P1  : 9.84132e-03 ± 5.21384e-04
  CSA_P2  : -4.28001e-05 ± 7.94005e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [12, 17, 39]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4689', '1.800', '0.1779', '1.800', '0.0999', '7.000', '0.7080', 1, 1, 1, 1, 1727270250.6098554]
VI_after__Init : ['1.201', '0.4691', '1.800', '0.1777', '1.800', '0.0942', '7.000', '0.7079', 1, 1, 1, 1, 1727270259.3241649]
VI_at__the_End : ['1.201', '0.5052', '1.800', '0.1361', '1.800', '0.1115', '7.000', '0.7088', 1, 1, 1, 1, 1727270318.1186776]