TEST_NAME : Wafer
TEST_DATE : 24_09_25-15_20_48
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-008-023-08 | FUSED_ID : 6359364768406471032
  IC_TEMP :  -52.00 | VDDM : 1125.44 | AUX_INT :   -7.12 | CsaBias :   65.95
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.07938e-04 / 2
  ADC_P0  : -7.12296e-03 ± 2.03518e-02
  ADC_P1  : 8.17373e-03 ± 4.81648e-04
  ADC_P2  : -6.11423e-06 ± 2.24689e-06
  CSA_Chi2/NDF : 8.17240e-05 / 2
  CSA_P0  : 5.79770e-02 ± 6.02972e-03
  CSA_P1  : 9.44090e-03 ± 4.54296e-04
  CSA_P2  : -3.84203e-05 ± 6.91839e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [67]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2674', '1.800', '0.1241', '1.800', '0.0852', '7.000', '0.7079', 1, 1, 1, 1, 1727270447.589942]
VI_after__Init : ['1.201', '0.2674', '1.800', '0.1238', '1.800', '0.0795', '7.000', '0.7077', 1, 1, 1, 1, 1727270456.3173325]
VI_at__the_End : ['1.201', '0.4955', '1.800', '0.1375', '1.803', '0.1106', '7.000', '0.7085', 1, 1, 1, 1, 1727270520.864516]