TEST_NAME : Wafer
TEST_DATE : 24_09_25-15_24_03
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-008-025-08 | FUSED_ID : 6359364768406471064
  IC_TEMP :  -55.16 | VDDM : 1108.68 | AUX_INT :   -7.10 | CsaBias :   81.69
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.44995e-04 / 2
  ADC_P0  : -7.10148e-03 ± 2.08222e-02
  ADC_P1  : 8.12881e-03 ± 5.02791e-04
  ADC_P2  : -5.18520e-06 ± 2.40333e-06
  CSA_Chi2/NDF : 1.20840e-04 / 2
  CSA_P0  : 5.84965e-02 ± 7.33208e-03
  CSA_P1  : 9.90857e-03 ± 5.52419e-04
  CSA_P2  : -4.54449e-05 ± 8.41269e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [53, 110]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [13]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2681', '1.800', '0.1485', '1.800', '0.0897', '7.000', '0.7076', 1, 1, 1, 1, 1727270643.0252218]
VI_after__Init : ['1.201', '0.2684', '1.800', '0.1485', '1.800', '0.0850', '7.000', '0.7076', 1, 1, 1, 1, 1727270651.0325954]
VI_at__the_End : ['1.201', '0.4968', '1.800', '0.1372', '1.800', '0.1114', '7.000', '0.7082', 1, 1, 1, 1, 1727270718.3444834]