TEST_NAME : Wafer
TEST_DATE : 24_09_25-15_25_41
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-008-026-08 | FUSED_ID : 6359364768406471080
  IC_TEMP :  -57.71 | VDDM : 1125.33 | AUX_INT :   -8.90 | CsaBias :   89.59
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.44436e-03 / 2
  ADC_P0  : -8.89921e-03 ± 2.57885e-02
  ADC_P1  : 8.27115e-03 ± 6.28948e-04
  ADC_P2  : -5.32323e-06 ± 3.05095e-06
  CSA_Chi2/NDF : 1.20992e-04 / 2
  CSA_P0  : 5.84281e-02 ± 7.33671e-03
  CSA_P1  : 9.49413e-03 ± 5.52768e-04
  CSA_P2  : -4.02897e-05 ± 8.41801e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [51]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2285', '1.800', '0.1823', '1.800', '0.0820', '7.000', '0.7077', 1, 1, 1, 1, 1727270741.153681]
VI_after__Init : ['1.201', '0.2286', '1.800', '0.1823', '1.801', '0.0768', '7.000', '0.7076', 1, 1, 1, 1, 1727270749.1901445]
VI_at__the_End : ['1.194', '0.4917', '1.800', '0.1381', '1.811', '0.1099', '7.000', '0.7086', 1, 1, 1, 1, 1727270808.0616896]