TEST_NAME : Wafer
TEST_DATE : 24_09_25-16_09_34
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-009-002-02 | FUSED_ID : 6359364768406474786
  IC_TEMP :  -65.01 | VDDM : 1115.26 | AUX_INT :   -8.92 | CsaBias :   66.76
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.38014e-03 / 2
  ADC_P0  : -8.91947e-03 ± 2.51455e-02
  ADC_P1  : 8.46739e-03 ± 6.13248e-04
  ADC_P2  : -6.48586e-06 ± 2.96009e-06
  CSA_Chi2/NDF : 1.68176e-04 / 2
  CSA_P0  : 5.78730e-02 ± 8.64978e-03
  CSA_P1  : 9.89116e-03 ± 6.51698e-04
  CSA_P2  : -4.59764e-05 ± 9.92459e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.2449', '1.800', '0.1318', '1.800', '0.0834', '7.000', '0.7077', 1, 1, 1, 1, 1727273373.5961516]
VI_after__Init : ['1.201', '0.2450', '1.800', '0.1317', '1.799', '0.0779', '7.000', '0.7079', 1, 1, 1, 1, 1727273382.3385541]
VI_at__the_End : ['1.201', '0.4940', '1.800', '0.1414', '1.799', '0.1135', '7.000', '0.7085', 1, 1, 1, 1, 1727273442.0988905]