TEST_NAME : Wafer
TEST_DATE : 24_09_25-16_07_56
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-009-003-02 | FUSED_ID : 6359364768406474802
  IC_TEMP :  -59.64 | VDDM : 1118.49 | AUX_INT :   -8.93 | CsaBias :   81.35
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.19059e-03 / 2
  ADC_P0  : -8.93138e-03 ± 2.33198e-02
  ADC_P1  : 8.27586e-03 ± 5.54216e-04
  ADC_P2  : -6.20091e-06 ± 2.61309e-06
  CSA_Chi2/NDF : 1.28047e-04 / 2
  CSA_P0  : 6.05995e-02 ± 7.54756e-03
  CSA_P1  : 1.01190e-02 ± 5.68654e-04
  CSA_P2  : -4.73223e-05 ± 8.65993e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [52, 63, 118]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3139', '1.800', '0.1378', '1.800', '0.0919', '7.000', '0.7076', 1, 1, 1, 1, 1727273276.1966765]
VI_after__Init : ['1.201', '0.3139', '1.800', '0.1378', '1.799', '0.0863', '7.000', '0.7080', 1, 1, 1, 1, 1727273284.3291287]
VI_at__the_End : ['1.202', '0.5064', '1.800', '0.1418', '1.799', '0.1135', '7.000', '0.7085', 1, 1, 1, 1, 1727273345.1593318]