TEST_NAME : Wafer
TEST_DATE : 24_09_25-16_06_18
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-009-004-02 | FUSED_ID : 6359364768406474818
  IC_TEMP :  -62.41 | VDDM : 1127.41 | AUX_INT :   -8.67 | CsaBias :   69.92
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.28184e-03 / 2
  ADC_P0  : -8.66877e-03 ± 2.41851e-02
  ADC_P1  : 8.80050e-03 ± 6.04157e-04
  ADC_P2  : -7.59650e-06 ± 2.97764e-06
  CSA_Chi2/NDF : 1.88731e-04 / 2
  CSA_P0  : 5.97915e-02 ± 9.16314e-03
  CSA_P1  : 1.06885e-02 ± 6.90377e-04
  CSA_P2  : -5.53849e-05 ± 1.05136e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3070', '1.800', '0.1508', '1.800', '0.0866', '7.000', '0.7078', 1, 1, 1, 1, 1727273177.5674133]
VI_after__Init : ['1.201', '0.3070', '1.800', '0.1506', '1.799', '0.0812', '7.000', '0.7076', 1, 1, 1, 1, 1727273186.441678]
VI_at__the_End : ['1.201', '0.5094', '1.800', '0.1425', '1.799', '0.1135', '7.000', '0.7085', 1, 1, 1, 1, 1727273246.4440722]