TEST_NAME : Wafer
TEST_DATE : 24_09_25-16_04_40
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-009-005-02 | FUSED_ID : 6359364768406474834
  IC_TEMP :  -53.90 | VDDM : 1117.54 | AUX_INT :  -32.93 | CsaBias :   72.18
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.28429e-03 / 2
  ADC_P0  : -3.29346e-02 ± 2.55533e-02
  ADC_P1  : 8.16142e-03 ± 5.86686e-04
  ADC_P2  : -5.82220e-06 ± 2.66326e-06
  CSA_Chi2/NDF : 9.61704e-05 / 2
  CSA_P0  : 5.88853e-02 ± 6.54098e-03
  CSA_P1  : 9.36408e-03 ± 4.92816e-04
  CSA_P2  : -3.79339e-05 ± 7.50500e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [43]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [16]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.2456', '1.800', '0.1533', '1.800', '0.0898', '7.000', '0.7076', 1, 1, 1, 1, 1727273080.5669665]
VI_after__Init : ['1.202', '0.2456', '1.800', '0.1534', '1.800', '0.0843', '7.000', '0.7076', 1, 1, 1, 1, 1727273088.8102882]
VI_at__the_End : ['1.202', '0.4947', '1.800', '0.1383', '1.803', '0.1117', '7.000', '0.7088', 1, 1, 1, 1, 1727273147.8208277]