TEST_NAME : Wafer
TEST_DATE : 24_09_25-16_03_02
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-009-006-02 | FUSED_ID : 6359364768406474850
  IC_TEMP :  -65.54 | VDDM : 1124.64 | AUX_INT :   -9.82 | CsaBias :   76.55
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.52982e-03 / 2
  ADC_P0  : -9.82400e-03 ± 2.64420e-02
  ADC_P1  : 8.71085e-03 ± 6.51240e-04
  ADC_P2  : -7.36251e-06 ± 3.17743e-06
  CSA_Chi2/NDF : 1.60831e-04 / 2
  CSA_P0  : 5.98687e-02 ± 8.45876e-03
  CSA_P1  : 9.95003e-03 ± 6.37307e-04
  CSA_P2  : -4.84706e-05 ± 9.70543e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [107]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [68, 97, 119]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2709', '1.800', '0.1862', '1.800', '0.0945', '7.000', '0.7085', 1, 1, 1, 1, 1727272982.5026398]
VI_after__Init : ['1.202', '0.2713', '1.800', '0.1863', '1.800', '0.0876', '7.000', '0.7076', 1, 1, 1, 1, 1727272990.6259089]
VI_at__the_End : ['1.202', '0.4900', '1.800', '0.1402', '1.800', '0.1144', '7.000', '0.7082', 1, 1, 1, 1, 1727273049.2884524]