TEST_NAME : Wafer
TEST_DATE : 24_09_25-15_59_47
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-009-008-02 | FUSED_ID : 6359364768406474882
  IC_TEMP :  -65.17 | VDDM : 1115.81 | AUX_INT :  -10.06 | CsaBias :   89.47
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.61360e-03 / 2
  ADC_P0  : -1.00638e-02 ± 2.72172e-02
  ADC_P1  : 8.36658e-03 ± 6.56718e-04
  ADC_P2  : -6.02976e-06 ± 3.15612e-06
  CSA_Chi2/NDF : 1.59831e-04 / 2
  CSA_P0  : 5.91116e-02 ± 8.43242e-03
  CSA_P1  : 9.83299e-03 ± 6.35322e-04
  CSA_P2  : -4.80607e-05 ± 9.67520e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [69]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [92]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3160', '1.800', '0.1653', '1.800', '0.0968', '7.000', '0.7077', 1, 1, 1, 1, 1727272787.5658448]
VI_after__Init : ['1.201', '0.3161', '1.800', '0.1654', '1.801', '0.0911', '7.000', '0.7074', 1, 1, 1, 1, 1727272795.7581792]
VI_at__the_End : ['1.202', '0.4808', '1.800', '0.1403', '1.806', '0.1163', '7.000', '0.7084', 1, 1, 1, 1, 1727272858.9942272]