TEST_NAME : Wafer
TEST_DATE : 24_09_25-15_51_38
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-009-013-02 | FUSED_ID : 6359364768406474962
  IC_TEMP :  -65.66 | VDDM : 1118.85 | AUX_INT :   -9.13 | CsaBias :   61.01
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.47500e-03 / 2
  ADC_P0  : -9.13380e-03 ± 2.59928e-02
  ADC_P1  : 8.82631e-03 ± 6.57333e-04
  ADC_P2  : -7.22161e-06 ± 3.28928e-06
  CSA_Chi2/NDF : 1.56791e-04 / 2
  CSA_P0  : 6.15401e-02 ± 8.35186e-03
  CSA_P1  : 1.03646e-02 ± 6.29252e-04
  CSA_P2  : -5.51002e-05 ± 9.58277e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [96]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [20]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.3292', '1.800', '0.1512', '1.800', '0.0911', '7.000', '0.7075', 1, 1, 1, 1, 1727272298.303529]
VI_after__Init : ['1.201', '0.3293', '1.800', '0.1512', '1.800', '0.0858', '7.000', '0.7075', 1, 1, 1, 1, 1727272306.3098435]
VI_at__the_End : ['1.201', '0.4917', '1.801', '0.1418', '1.800', '0.1164', '7.000', '0.7084', 1, 1, 1, 1, 1727272369.517865]