TEST_NAME : Wafer
TEST_DATE : 24_09_25-15_50_00
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-009-014-02 | FUSED_ID : 6359364768406474978
  IC_TEMP :  -58.45 | VDDM : 1120.29 | AUX_INT :   -8.50 | CsaBias :   74.99
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.28857e-03 / 2
  ADC_P0  : -8.49501e-03 ± 2.43230e-02
  ADC_P1  : 8.40742e-03 ± 5.98281e-04
  ADC_P2  : -5.88121e-06 ± 2.91751e-06
  CSA_Chi2/NDF : 1.29632e-04 / 2
  CSA_P0  : 5.97695e-02 ± 7.59415e-03
  CSA_P1  : 1.01847e-02 ± 5.72165e-04
  CSA_P2  : -5.14254e-05 ± 8.71339e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [15]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3311', '1.800', '0.1370', '1.799', '0.0925', '7.000', '0.7075', 1, 1, 1, 1, 1727272200.6023993]
VI_after__Init : ['1.201', '0.3310', '1.800', '0.1371', '1.800', '0.0866', '7.000', '0.7076', 1, 1, 1, 1, 1727272208.8027542]
VI_at__the_End : ['1.201', '0.4906', '1.800', '0.1392', '1.803', '0.1146', '7.000', '0.7080', 1, 1, 1, 1, 1727272269.11994]