TEST_NAME : Wafer
TEST_DATE : 24_09_25-15_48_23
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-009-015-02 | FUSED_ID : 6359364768406474994
  IC_TEMP :  -57.81 | VDDM : 1127.93 | AUX_INT :   -8.81 | CsaBias :   83.49
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.37467e-03 / 2
  ADC_P0  : -8.80858e-03 ± 2.50956e-02
  ADC_P1  : 8.46223e-03 ± 6.12031e-04
  ADC_P2  : -6.47184e-06 ± 2.95422e-06
  CSA_Chi2/NDF : 9.42290e-05 / 2
  CSA_P0  : 6.03320e-02 ± 6.47462e-03
  CSA_P1  : 9.67027e-03 ± 4.87816e-04
  CSA_P2  : -4.27689e-05 ± 7.42886e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [2, 97]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [69]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3741', '1.800', '0.1758', '1.799', '0.0933', '7.000', '0.7074', 1, 1, 1, 1, 1727272102.8173594]
VI_after__Init : ['1.201', '0.3731', '1.800', '0.1758', '1.804', '0.0880', '7.000', '0.7073', 1, 1, 1, 1, 1727272111.064717]
VI_at__the_End : ['1.201', '0.4948', '1.800', '0.1389', '1.799', '0.1122', '7.000', '0.7082', 1, 1, 1, 1, 1727272174.870433]