TEST_NAME : Wafer
TEST_DATE : 24_09_25-15_46_44
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-009-016-05 | FUSED_ID : 6359364768406475013
  IC_TEMP :  -55.64 | VDDM : 1127.12 | AUX_INT :   -7.77 | CsaBias :   89.67
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.03790e-03 / 2
  ADC_P0  : -7.77458e-03 ± 2.18055e-02
  ADC_P1  : 8.18734e-03 ± 5.23749e-04
  ADC_P2  : -5.58348e-06 ± 2.49213e-06
  CSA_Chi2/NDF : 1.02464e-04 / 2
  CSA_P0  : 5.88164e-02 ± 6.75163e-03
  CSA_P1  : 9.92814e-03 ± 5.08687e-04
  CSA_P2  : -4.54861e-05 ± 7.74670e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [58, 103]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.3234', '1.800', '0.1578', '1.800', '0.0906', '7.000', '0.7081', 1, 1, 1, 1, 1727272004.5614367]
VI_after__Init : ['1.201', '0.3233', '1.799', '0.1577', '1.801', '0.0840', '7.000', '0.7072', 1, 1, 1, 1, 1727272012.7586966]
VI_at__the_End : ['1.201', '0.5001', '1.800', '0.1386', '1.803', '0.1121', '7.000', '0.7079', 1, 1, 1, 1, 1727272073.5336885]