TEST_NAME : Wafer
TEST_DATE : 24_09_25-15_41_51
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-009-019-05 | FUSED_ID : 6359364768406475061
  IC_TEMP :  -58.81 | VDDM : 1122.38 | AUX_INT :   -9.13 | CsaBias :   81.22
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.30276e-03 / 2
  ADC_P0  : -9.13102e-03 ± 2.44374e-02
  ADC_P1  : 8.27702e-03 ± 5.87656e-04
  ADC_P2  : -5.76147e-06 ± 2.81137e-06
  CSA_Chi2/NDF : 1.41591e-04 / 2
  CSA_P0  : 5.91635e-02 ± 7.93671e-03
  CSA_P1  : 9.85965e-03 ± 5.97974e-04
  CSA_P2  : -4.69219e-05 ± 9.10644e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [58]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [61]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2623', '1.800', '0.1791', '1.799', '0.0866', '7.000', '0.7069', 1, 1, 1, 1, 1727271711.0860674]
VI_after__Init : ['1.201', '0.2624', '1.800', '0.1791', '1.801', '0.0810', '7.000', '0.7072', 1, 1, 1, 1, 1727271719.8673255]
VI_at__the_End : ['1.201', '0.4946', '1.800', '0.1397', '1.799', '0.1126', '7.000', '0.7082', 1, 1, 1, 1, 1727271782.8999155]