TEST_NAME : Wafer
TEST_DATE : 24_09_25-15_40_14
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-009-020-05 | FUSED_ID : 6359364768406475077
  IC_TEMP :  -56.42 | VDDM : 1129.94 | AUX_INT :  -93.28 | CsaBias :    1.18
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.08665e-03 / 2
  ADC_P0  : -9.32793e-02 ± 2.62948e-02
  ADC_P1  : 9.54757e-03 ± 6.16966e-04
  ADC_P2  : -1.01483e-05 ± 2.84285e-06
  CSA_Chi2/NDF : 1.27060e-04 / 2
  CSA_P0  : 6.01316e-02 ± 7.51842e-03
  CSA_P1  : 9.88741e-03 ± 5.66459e-04
  CSA_P2  : -4.62009e-05 ± 8.62650e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [73]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2292', '1.800', '0.1430', '1.800', '0.0925', '7.000', '0.7070', 1, 1, 1, 1, 1727271614.1336553]
VI_after__Init : ['1.201', '0.2293', '1.800', '0.1429', '1.800', '0.0872', '7.000', '0.7070', 1, 1, 1, 1, 1727271622.3059857]
VI_at__the_End : ['1.201', '0.4916', '1.800', '0.1424', '1.805', '0.1137', '7.000', '0.7077', 1, 1, 1, 1, 1727271681.0675423]