TEST_NAME : Wafer
TEST_DATE : 24_09_25-15_38_36
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-009-021-05 | FUSED_ID : 6359364768406475093
  IC_TEMP :  -60.60 | VDDM : 1126.14 | AUX_INT :  -10.20 | CsaBias :   83.41
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.73407e-03 / 2
  ADC_P0  : -1.01968e-02 ± 2.81859e-02
  ADC_P1  : 8.58731e-03 ± 6.86126e-04
  ADC_P2  : -7.03238e-06 ± 3.31162e-06
  CSA_Chi2/NDF : 1.17851e-04 / 2
  CSA_P0  : 6.02690e-02 ± 7.24085e-03
  CSA_P1  : 1.00038e-02 ± 5.45545e-04
  CSA_P2  : -4.65318e-05 ± 8.30801e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [87, 123]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.3314', '1.800', '0.1801', '1.800', '0.0922', '7.000', '0.7071', 1, 1, 1, 1, 1727271516.211929]
VI_after__Init : ['1.202', '0.3314', '1.800', '0.1800', '1.800', '0.0867', '7.000', '0.7072', 1, 1, 1, 1, 1727271524.376453]
VI_at__the_End : ['1.201', '0.5019', '1.800', '0.1390', '1.799', '0.1135', '7.000', '0.7076', 1, 1, 1, 1, 1727271591.368312]