TEST_NAME : Wafer
TEST_DATE : 24_09_25-15_33_42
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-009-024-05 | FUSED_ID : 6359364768406475141
  IC_TEMP :  -58.26 | VDDM : 1111.56 | AUX_INT :   -8.86 | CsaBias :   83.21
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.31149e-03 / 2
  ADC_P0  : -8.85520e-03 ± 2.45198e-02
  ADC_P1  : 8.43692e-03 ± 5.99877e-04
  ADC_P2  : -6.15691e-06 ± 2.91165e-06
  CSA_Chi2/NDF : 1.48917e-04 / 2
  CSA_P0  : 5.81165e-02 ± 8.13943e-03
  CSA_P1  : 1.00276e-02 ± 6.13247e-04
  CSA_P2  : -4.72349e-05 ± 9.33903e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [103, 107]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [30, 46]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1729', '1.800', '0.1336', '1.799', '0.0818', '7.000', '0.7073', 1, 1, 1, 1, 1727271221.95739]
VI_after__Init : ['1.201', '0.1728', '1.800', '0.1335', '1.799', '0.0765', '7.000', '0.7075', 1, 1, 1, 1, 1727271230.036775]
VI_at__the_End : ['1.201', '0.4981', '1.800', '0.1363', '1.799', '0.1125', '7.000', '0.7079', 1, 1, 1, 1, 1727271289.3452942]