TEST_NAME : Wafer
TEST_DATE : 24_09_25-15_32_04
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-009-025-05 | FUSED_ID : 6359364768406475157
  IC_TEMP :  -60.42 | VDDM : 1121.82 | AUX_INT :   -8.21 | CsaBias :   76.35
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.09773e-03 / 2
  ADC_P0  : -8.20745e-03 ± 2.24302e-02
  ADC_P1  : 8.51507e-03 ± 5.60152e-04
  ADC_P2  : -5.94442e-06 ± 2.77740e-06
  CSA_Chi2/NDF : 1.62193e-04 / 2
  CSA_P0  : 6.01885e-02 ± 8.49451e-03
  CSA_P1  : 1.04206e-02 ± 6.40000e-04
  CSA_P2  : -5.17294e-05 ± 9.74644e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [4, 62, 76]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [6, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3181', '1.800', '0.1631', '1.799', '0.0921', '7.000', '0.7083', 1, 1, 1, 1, 1727271124.0548098]
VI_after__Init : ['1.201', '0.3185', '1.800', '0.1631', '1.800', '0.0849', '7.000', '0.7076', 1, 1, 1, 1, 1727271132.8401465]
VI_at__the_End : ['1.201', '0.5077', '1.800', '0.1418', '1.803', '0.1126', '7.000', '0.7083', 1, 1, 1, 1, 1727271198.342104]