TEST_NAME : Wafer
TEST_DATE : 24_09_25-15_30_26
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-009-026-05 | FUSED_ID : 6359364768406475173
  IC_TEMP :  -56.32 | VDDM : 1126.92 | AUX_INT :   -7.77 | CsaBias :   66.87
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.36701e-04 / 2
  ADC_P0  : -7.77053e-03 ± 2.06685e-02
  ADC_P1  : 8.35047e-03 ± 4.97967e-04
  ADC_P2  : -6.37883e-06 ± 2.37088e-06
  CSA_Chi2/NDF : 1.21031e-04 / 2
  CSA_P0  : 6.01606e-02 ± 7.33789e-03
  CSA_P1  : 9.68306e-03 ± 5.52857e-04
  CSA_P2  : -4.24877e-05 ± 8.41936e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [60]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [119]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.3671', '1.800', '0.1604', '1.799', '0.0965', '7.000', '0.7076', 1, 1, 1, 1, 1727271026.3362155]
VI_after__Init : ['1.201', '0.3672', '1.800', '0.1603', '1.800', '0.0912', '7.000', '0.7076', 1, 1, 1, 1, 1727271034.38661]
VI_at__the_End : ['1.201', '0.4976', '1.800', '0.1400', '1.805', '0.1117', '7.000', '0.7081', 1, 1, 1, 1, 1727271101.8423939]