TEST_NAME : Wafer
TEST_DATE : 24_09_25-15_28_48
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-009-027-05 | FUSED_ID : 6359364768406475189
  IC_TEMP :  -58.91 | VDDM : 1123.13 | AUX_INT :   -9.42 | CsaBias :   76.43
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.43882e-03 / 2
  ADC_P0  : -9.42035e-03 ± 2.56715e-02
  ADC_P1  : 8.65226e-03 ± 6.37721e-04
  ADC_P2  : -6.75588e-06 ± 3.14389e-06
  CSA_Chi2/NDF : 1.11057e-04 / 2
  CSA_P0  : 5.76881e-02 ± 7.02904e-03
  CSA_P1  : 9.75320e-03 ± 5.29587e-04
  CSA_P2  : -4.43795e-05 ± 8.06499e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [91]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [31]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3359', '1.800', '0.1487', '1.800', '0.0964', '7.000', '0.7083', 1, 1, 1, 1, 1727270928.7224813]
VI_after__Init : ['1.201', '0.3358', '1.800', '0.1487', '1.800', '0.0886', '7.000', '0.7075', 1, 1, 1, 1, 1727270936.818995]
VI_at__the_End : ['1.201', '0.4943', '1.800', '0.1352', '1.800', '0.1114', '7.000', '0.7082', 1, 1, 1, 1, 1727270997.8323412]