TEST_NAME : Wafer
TEST_DATE : 24_09_25-16_11_11
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-010-002-12 | FUSED_ID : 6359364768406478892
  IC_TEMP :  -67.84 | VDDM : 1111.93 | AUX_INT :  -10.76 | CsaBias :   66.34
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.81618e-03 / 2
  ADC_P0  : -1.07612e-02 ± 2.88235e-02
  ADC_P1  : 8.63273e-03 ± 6.97921e-04
  ADC_P2  : -7.36838e-06 ± 3.35279e-06
  CSA_Chi2/NDF : 1.43283e-04 / 2
  CSA_P0  : 5.71744e-02 ± 7.98398e-03
  CSA_P1  : 9.70232e-03 ± 6.01535e-04
  CSA_P2  : -4.62652e-05 ± 9.16067e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [45, 50, 63]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2638', '1.800', '0.1836', '1.800', '0.0893', '7.000', '0.7078', 1, 1, 1, 1, 1727273471.3676426]
VI_after__Init : ['1.201', '0.2638', '1.801', '0.1837', '1.801', '0.0839', '7.000', '0.7076', 1, 1, 1, 1, 1727273479.5279496]
VI_at__the_End : ['1.201', '0.4812', '1.800', '0.1371', '1.808', '0.1151', '7.000', '0.7086', 1, 1, 1, 1, 1727273541.663101]