TEST_NAME : Wafer
TEST_DATE : 24_09_25-16_12_50
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-010-003-12 | FUSED_ID : 6359364768406478908
  IC_TEMP :  -55.71 | VDDM : 1123.17 | AUX_INT :   -9.13 | CsaBias :   72.06
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.68968e-03 / 2
  ADC_P0  : -9.12972e-03 ± 2.79149e-02
  ADC_P1  : 8.17236e-03 ± 6.70794e-04
  ADC_P2  : -5.32331e-06 ± 3.20137e-06
  CSA_Chi2/NDF : 9.76994e-05 / 2
  CSA_P0  : 5.91465e-02 ± 6.59278e-03
  CSA_P1  : 9.45187e-03 ± 4.96718e-04
  CSA_P2  : -3.85119e-05 ± 7.56443e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [23, 97]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2628', '1.800', '0.1554', '1.800', '0.0881', '7.000', '0.7088', 1, 1, 1, 1, 1727273570.1698604]
VI_after__Init : ['1.201', '0.2628', '1.800', '0.1554', '1.800', '0.0804', '7.000', '0.7076', 1, 1, 1, 1, 1727273578.153448]
VI_at__the_End : ['1.201', '0.4983', '1.800', '0.1401', '1.805', '0.1121', '7.000', '0.7084', 1, 1, 1, 1, 1727273637.5437]