TEST_NAME : Wafer
TEST_DATE : 24_09_25-16_14_28
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-010-004-12 | FUSED_ID : 6359364768406478924
  IC_TEMP :  -57.66 | VDDM : 1102.78 | AUX_INT :   -8.93 | CsaBias :   81.75
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.35929e-03 / 2
  ADC_P0  : -8.92929e-03 ± 2.49467e-02
  ADC_P1  : 8.31311e-03 ± 5.96188e-04
  ADC_P2  : -6.29646e-06 ± 2.82127e-06
  CSA_Chi2/NDF : 1.02696e-04 / 2
  CSA_P0  : 6.03316e-02 ± 6.75925e-03
  CSA_P1  : 9.72325e-03 ± 5.09261e-04
  CSA_P2  : -4.12227e-05 ± 7.75544e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [29, 45, 62, 95]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [102]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2973', '1.800', '0.1158', '1.800', '0.0871', '7.000', '0.7086', 1, 1, 1, 1, 1727273668.1902685]
VI_after__Init : ['1.201', '0.2973', '1.800', '0.1158', '1.800', '0.0801', '7.000', '0.7076', 1, 1, 1, 1, 1727273676.271762]
VI_at__the_End : ['1.201', '0.5060', '1.800', '0.1381', '1.803', '0.1099', '7.000', '0.7084', 1, 1, 1, 1, 1727273741.5257]