TEST_NAME : Wafer
TEST_DATE : 24_09_25-16_17_42
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-010-006-12 | FUSED_ID : 6359364768406478956
  IC_TEMP :  -58.76 | VDDM : 1121.80 | AUX_INT :   -7.97 | CsaBias :   75.24
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.11685e-03 / 2
  ADC_P0  : -7.97051e-03 ± 2.26030e-02
  ADC_P1  : 8.38363e-03 ± 5.49350e-04
  ADC_P2  : -6.25623e-06 ± 2.63955e-06
  CSA_Chi2/NDF : 1.18536e-04 / 2
  CSA_P0  : 5.87439e-02 ± 7.26186e-03
  CSA_P1  : 9.65038e-03 ± 5.47129e-04
  CSA_P2  : -4.15505e-05 ± 8.33213e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [34, 92]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [90, 110]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4267', '1.800', '0.1806', '1.800', '0.0976', '7.000', '0.7085', 1, 1, 1, 1, 1727273862.292518]
VI_after__Init : ['1.202', '0.4270', '1.800', '0.1807', '1.800', '0.0896', '7.000', '0.7077', 1, 1, 1, 1, 1727273870.325852]
VI_at__the_End : ['1.202', '0.4980', '1.800', '0.1391', '1.804', '0.1132', '7.000', '0.7085', 1, 1, 1, 1, 1727273934.4020915]