TEST_NAME : Wafer
TEST_DATE : 24_09_25-16_20_58
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-010-008-12 | FUSED_ID : 6359364768406478988
  IC_TEMP :  -66.80 | VDDM : 1129.57 | AUX_INT :  -45.69 | CsaBias :   47.64
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.23393e-03 / 2
  ADC_P0  : -4.56860e-02 ± 2.55766e-02
  ADC_P1  : 9.42743e-03 ± 6.41957e-04
  ADC_P2  : -9.43659e-06 ± 3.15724e-06
  CSA_Chi2/NDF : 1.75302e-04 / 2
  CSA_P0  : 5.87465e-02 ± 8.83113e-03
  CSA_P1  : 1.05746e-02 ± 6.65362e-04
  CSA_P2  : -5.66388e-05 ± 1.01327e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [109]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [34, 51]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2168', '1.800', '0.1418', '1.800', '0.0870', '7.000', '0.7083', 1, 1, 1, 1, 1727274058.1207762]
VI_after__Init : ['1.201', '0.2169', '1.800', '0.1418', '1.800', '0.0817', '7.000', '0.7079', 1, 1, 1, 1, 1727274066.833069]
VI_at__the_End : ['1.202', '0.4945', '1.800', '0.1409', '1.800', '0.1142', '7.000', '0.7086', 1, 1, 1, 1, 1727274125.5256796]