TEST_NAME : Wafer
TEST_DATE : 24_09_25-16_22_36
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-010-009-12 | FUSED_ID : 6359364768406479004
  IC_TEMP :  -54.28 | VDDM : 1119.01 | AUX_INT :   -9.01 | CsaBias :   89.54
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.45128e-03 / 2
  ADC_P0  : -9.00552e-03 ± 2.58502e-02
  ADC_P1  : 8.27605e-03 ± 6.30452e-04
  ADC_P2  : -5.33594e-06 ± 3.05825e-06
  CSA_Chi2/NDF : 1.32191e-04 / 2
  CSA_P0  : 5.96879e-02 ± 7.66872e-03
  CSA_P1  : 9.96643e-03 ± 5.77783e-04
  CSA_P2  : -4.67499e-05 ± 8.79895e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [55]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2491', '1.800', '0.1590', '1.799', '0.0859', '7.000', '0.7079', 1, 1, 1, 1, 1727274156.2693512]
VI_after__Init : ['1.202', '0.2491', '1.800', '0.1591', '1.800', '0.0809', '7.000', '0.7079', 1, 1, 1, 1, 1727274164.3116305]
VI_at__the_End : ['1.201', '0.4990', '1.800', '0.1394', '1.799', '0.1135', '7.000', '0.7086', 1, 1, 1, 1, 1727274223.7511606]