TEST_NAME : Wafer
TEST_DATE : 24_09_25-16_24_15
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-010-010-12 | FUSED_ID : 6359364768406479020
  IC_TEMP :  -52.50 | VDDM : 1126.54 | AUX_INT :   -8.17 | CsaBias :   96.04
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.04696e-03 / 2
  ADC_P0  : -8.16673e-03 ± 2.18775e-02
  ADC_P1  : 8.09052e-03 ± 5.12410e-04
  ADC_P2  : -5.75208e-06 ± 2.38030e-06
  CSA_Chi2/NDF : 6.11625e-05 / 2
  CSA_P0  : 5.80559e-02 ± 5.21633e-03
  CSA_P1  : 9.07556e-03 ± 3.93013e-04
  CSA_P2  : -3.45549e-05 ± 5.98512e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [4]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [84]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2030', '1.800', '0.1620', '1.800', '0.0887', '7.000', '0.7077', 1, 1, 1, 1, 1727274255.0367987]
VI_after__Init : ['1.202', '0.2030', '1.799', '0.1621', '1.801', '0.0836', '7.000', '0.7079', 1, 1, 1, 1, 1727274263.1281168]
VI_at__the_End : ['1.202', '0.4899', '1.800', '0.1360', '1.800', '0.1125', '7.000', '0.7085', 1, 1, 1, 1, 1727274326.7713277]