TEST_NAME : Wafer
TEST_DATE : 24_09_25-16_25_52
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-010-011-12 | FUSED_ID : 6359364768406479036
  IC_TEMP :  -54.06 | VDDM : 1129.41 | AUX_INT :   -8.25 | CsaBias :   91.86
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.32124e-03 / 2
  ADC_P0  : -8.25039e-03 ± 2.46218e-02
  ADC_P1  : 8.41645e-03 ± 6.03692e-04
  ADC_P2  : -6.13047e-06 ± 2.92750e-06
  CSA_Chi2/NDF : 9.15852e-05 / 2
  CSA_P0  : 5.98786e-02 ± 6.38315e-03
  CSA_P1  : 9.41566e-03 ± 4.80924e-04
  CSA_P2  : -3.95318e-05 ± 7.32391e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [77, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [1, 89]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4126', '1.800', '0.1408', '1.800', '0.0953', '7.000', '0.7078', 1, 1, 1, 1, 1727274352.2833958]
VI_after__Init : ['1.201', '0.4128', '1.800', '0.1408', '1.799', '0.0898', '7.000', '0.7077', 1, 1, 1, 1, 1727274360.3407514]
VI_at__the_End : ['1.202', '0.4948', '1.800', '0.1376', '1.805', '0.1107', '7.000', '0.7087', 1, 1, 1, 1, 1727274423.1888459]