TEST_NAME : Wafer
TEST_DATE : 24_09_25-16_27_30
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-010-012-12 | FUSED_ID : 6359364768406479052
  IC_TEMP :  -62.90 | VDDM : 1124.99 | AUX_INT :   -8.97 | CsaBias :   76.60
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.25577e-03 / 2
  ADC_P0  : -8.96980e-03 ± 2.39382e-02
  ADC_P1  : 8.62874e-03 ± 5.87508e-04
  ADC_P2  : -7.12686e-06 ± 2.85328e-06
  CSA_Chi2/NDF : 1.31814e-04 / 2
  CSA_P0  : 5.94291e-02 ± 7.65780e-03
  CSA_P1  : 1.00078e-02 ± 5.76960e-04
  CSA_P2  : -4.96075e-05 ± 8.78641e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [63, 89]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2414', '1.800', '0.1710', '1.800', '0.0866', '7.000', '0.7079', 1, 1, 1, 1, 1727274450.5178134]
VI_after__Init : ['1.201', '0.2414', '1.800', '0.1709', '1.801', '0.0815', '7.000', '0.7078', 1, 1, 1, 1, 1727274458.6022296]
VI_at__the_End : ['1.201', '0.4890', '1.800', '0.1387', '1.804', '0.1141', '7.000', '0.7086', 1, 1, 1, 1, 1727274518.1715825]