TEST_NAME : Wafer
TEST_DATE : 24_09_25-16_29_08
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-010-013-12 | FUSED_ID : 6359364768406479068
  IC_TEMP :  -54.78 | VDDM : 1123.59 | AUX_INT :  -10.12 | CsaBias :   86.43
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.97083e-03 / 2
  ADC_P0  : -1.01210e-02 ± 3.01583e-02
  ADC_P1  : 8.11038e-03 ± 7.12768e-04
  ADC_P2  : -5.40369e-06 ± 3.35072e-06
  CSA_Chi2/NDF : 9.35668e-05 / 2
  CSA_P0  : 6.05279e-02 ± 6.45183e-03
  CSA_P1  : 9.77885e-03 ± 4.86099e-04
  CSA_P2  : -4.39661e-05 ± 7.40272e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [88]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [48, 69]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1781', '1.800', '0.1595', '1.799', '0.0857', '7.000', '0.7078', 1, 1, 1, 1, 1727274548.172268]
VI_after__Init : ['1.202', '0.1781', '1.800', '0.1594', '1.800', '0.0803', '7.000', '0.7078', 1, 1, 1, 1, 1727274556.1907127]
VI_at__the_End : ['1.201', '0.4987', '1.800', '0.1397', '1.800', '0.1115', '7.000', '0.7086', 1, 1, 1, 1, 1727274615.737165]