TEST_NAME : Wafer
TEST_DATE : 24_09_25-16_30_45
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-010-014-12 | FUSED_ID : 6359364768406479084
  IC_TEMP :  -56.31 | VDDM : 1131.67 | AUX_INT :   -7.94 | CsaBias :   69.69
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.11436e-03 / 2
  ADC_P0  : -7.94332e-03 ± 2.26001e-02
  ADC_P1  : 8.68321e-03 ± 5.74547e-04
  ADC_P2  : -6.33141e-06 ± 2.89174e-06
  CSA_Chi2/NDF : 1.05664e-04 / 2
  CSA_P0  : 6.08987e-02 ± 6.85624e-03
  CSA_P1  : 1.00851e-02 ± 5.16568e-04
  CSA_P2  : -4.82101e-05 ± 7.86673e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [113]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2550', '1.800', '0.1746', '1.800', '0.0933', '7.000', '0.7080', 1, 1, 1, 1, 1727274645.5338447]
VI_after__Init : ['1.201', '0.2551', '1.800', '0.1746', '1.800', '0.0877', '7.000', '0.7077', 1, 1, 1, 1, 1727274653.7703042]
VI_at__the_End : ['1.202', '0.5008', '1.800', '0.1405', '1.800', '0.1122', '7.000', '0.7084', 1, 1, 1, 1, 1727274712.64577]