TEST_NAME : Wafer
TEST_DATE : 24_09_25-16_32_23
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-010-015-12 | FUSED_ID : 6359364768406479100
  IC_TEMP :  -56.63 | VDDM : 1128.13 | AUX_INT :   -7.71 | CsaBias :   81.91
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.13165e-04 / 2
  ADC_P0  : -7.70925e-03 ± 2.04013e-02
  ADC_P1  : 8.21601e-03 ± 4.81775e-04
  ADC_P2  : -6.25070e-06 ± 2.24937e-06
  CSA_Chi2/NDF : 9.25380e-05 / 2
  CSA_P0  : 5.85495e-02 ± 6.41627e-03
  CSA_P1  : 9.51067e-03 ± 4.83419e-04
  CSA_P2  : -4.19362e-05 ± 7.36190e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [7]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4702', '1.800', '0.1484', '1.800', '0.0968', '7.000', '0.7079', 1, 1, 1, 1, 1727274743.352525]
VI_after__Init : ['1.201', '0.4704', '1.800', '0.1485', '1.800', '0.0912', '7.000', '0.7079', 1, 1, 1, 1, 1727274751.4508018]
VI_at__the_End : ['1.201', '0.4887', '1.800', '0.1383', '1.800', '0.1125', '7.000', '0.7085', 1, 1, 1, 1, 1727274811.0801487]