TEST_NAME : Wafer
TEST_DATE : 24_09_25-16_38_54
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-010-019-11 | FUSED_ID : 6359364768406479163
  IC_TEMP :  -65.46 | VDDM : 1121.80 | AUX_INT :   -9.95 | CsaBias :   74.60
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.62233e-03 / 2
  ADC_P0  : -9.95162e-03 ± 2.73003e-02
  ADC_P1  : 8.51668e-03 ± 6.72357e-04
  ADC_P2  : -6.18127e-06 ± 3.29702e-06
  CSA_Chi2/NDF : 2.08772e-04 / 2
  CSA_P0  : 5.82173e-02 ± 9.63736e-03
  CSA_P1  : 1.02936e-02 ± 7.26106e-04
  CSA_P2  : -5.45840e-05 ± 1.10577e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [37, 56]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [54, 91]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3763', '1.800', '0.1651', '1.800', '0.1003', '7.000', '0.7086', 1, 1, 1, 1, 1727275133.69648]
VI_after__Init : ['1.201', '0.3767', '1.800', '0.1651', '1.799', '0.0928', '7.000', '0.7078', 1, 1, 1, 1, 1727275142.3658292]
VI_at__the_End : ['1.201', '0.4808', '1.800', '0.1405', '1.800', '0.1177', '7.000', '0.7086', 1, 1, 1, 1, 1727275202.1652086]