TEST_NAME : Wafer
TEST_DATE : 24_09_25-16_40_31
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-010-020-11 | FUSED_ID : 6359364768406479179
  IC_TEMP :  -60.37 | VDDM : 1120.32 | AUX_INT :   -7.42 | CsaBias :   72.46
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.19566e-03 / 2
  ADC_P0  : -7.42382e-03 ± 2.34411e-02
  ADC_P1  : 8.04035e-03 ± 5.57754e-04
  ADC_P2  : -5.20012e-06 ± 2.62353e-06
  CSA_Chi2/NDF : 1.29356e-04 / 2
  CSA_P0  : 5.74194e-02 ± 7.58604e-03
  CSA_P1  : 1.00177e-02 ± 5.71553e-04
  CSA_P2  : -4.92129e-05 ± 8.70408e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [12, 44, 101]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [0, 10, 63, 96]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.3561', '1.800', '0.1492', '1.800', '0.0925', '7.000', '0.7079', 1, 1, 1, 1, 1727275231.5159485]
VI_after__Init : ['1.201', '0.3564', '1.800', '0.1493', '1.801', '0.0867', '7.000', '0.7078', 1, 1, 1, 1, 1727275239.6873302]
VI_at__the_End : ['1.201', '0.4891', '1.800', '0.1356', '1.800', '0.1155', '7.000', '0.7086', 1, 1, 1, 1, 1727275304.8433154]