TEST_NAME : Wafer
TEST_DATE : 24_09_25-16_42_09
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-010-021-11 | FUSED_ID : 6359364768406479195
  IC_TEMP :  -63.94 | VDDM : 1120.66 | AUX_INT :   -7.53 | CsaBias :   64.45
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.19256e-03 / 2
  ADC_P0  : -7.52804e-03 ± 2.34106e-02
  ADC_P1  : 8.04496e-03 ± 5.57029e-04
  ADC_P2  : -5.21127e-06 ± 2.62013e-06
  CSA_Chi2/NDF : 1.51873e-04 / 2
  CSA_P0  : 5.99499e-02 ± 8.21982e-03
  CSA_P1  : 1.00468e-02 ± 6.19304e-04
  CSA_P2  : -4.91708e-05 ± 9.43127e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [39, 104]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [83]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3751', '1.800', '0.1463', '1.800', '0.0932', '7.000', '0.7079', 1, 1, 1, 1, 1727275329.1904545]
VI_after__Init : ['1.202', '0.3754', '1.800', '0.1461', '1.800', '0.0878', '7.000', '0.7078', 1, 1, 1, 1, 1727275337.9038432]
VI_at__the_End : ['1.201', '0.4942', '1.805', '0.1383', '1.800', '0.1136', '7.000', '0.7088', 1, 1, 1, 1, 1727275402.205785]