TEST_NAME : Wafer
TEST_DATE : 24_09_25-16_45_25
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-010-023-11 | FUSED_ID : 6359364768406479227
  IC_TEMP :  -54.77 | VDDM : 1124.88 | AUX_INT :  -35.77 | CsaBias :   58.00
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.53391e-03 / 2
  ADC_P0  : -3.57662e-02 ± 2.79207e-02
  ADC_P1  : 8.60336e-03 ± 6.56343e-04
  ADC_P2  : -7.19553e-06 ± 3.05427e-06
  CSA_Chi2/NDF : 1.15448e-04 / 2
  CSA_P0  : 5.60079e-02 ± 7.16664e-03
  CSA_P1  : 9.86026e-03 ± 5.39955e-04
  CSA_P2  : -4.37999e-05 ± 8.22287e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [12, 103]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [49, 121]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.2140', '1.799', '0.1784', '1.800', '0.0929', '7.000', '0.7080', 1, 1, 1, 1, 1727275525.096419]
VI_after__Init : ['1.202', '0.2140', '1.800', '0.1783', '1.800', '0.0872', '7.000', '0.7079', 1, 1, 1, 1, 1727275533.8027632]
VI_at__the_End : ['1.201', '0.4970', '1.800', '0.1375', '1.800', '0.1121', '7.000', '0.7086', 1, 1, 1, 1, 1727275593.0511165]